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Improvement of alternative non-raster scanning methods for high speed atomic force microscopy: A review

SK Das, FR Badal, MA Rahman, MA Islam… - IEEE …, 2019 - ieeexplore.ieee.org
The invention of the nanotechnology adds a new branch to investigate and control the
physical properties of matters at atomic level. The aim of this technology is to image the …
被引用次数：31 相关文章

[引用][C] Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force Microscopy: A Review

SK Das, FR Badal, MA Rahman, MA Islam, SK Sarker… - IEEE Access, 2019 - cir.nii.ac.jp
Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force
Microscopy: A Review | CiNii Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細 …

[引用][C] Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force Microscopy: A Review

SK Das, FR Badal, MA Rahman, MA Islam… - IEEE …, 2019 - ui.adsabs.harvard.edu
Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force
Microscopy: A Review - NASA/ADS Now on home page ads icon ads Enable full ADS view …
[PDF] researchgate.net

[PDF][PDF] Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force Microscopy: A Review

SK DAS, FR BADAL, MDA RAHMAN, MDA ISLAM… - researchgate.net
The invention of the nanotechnology adds a new branch to investigate and control the
physical properties of matters at atomic level. The aim of this technology is to image the …
[PDF] academia.edu

[PDF][PDF] Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force Microscopy: A Review

SK DAS, FR BADAL, MDA RAHMAN, MDA ISLAM… - academia.edu
The invention of the nanotechnology adds a new branch to investigate and control the
physical properties of matters at atomic level. The aim of this technology is to image the …