Evidence for a self-propagating melt in amorphous silicon upon pulsed-laser irradiation

W Sinke, FW Saris - Physical Review Letters, 1984 - APS
A double-peak structure is observed in the Cu concentration profile after low-energy pulsed-
laser irradiation of Cu-implanted Si. From the Cu surface segregation a primary melt depth is …
被引用次数：72 相关文章

Evidence for a Self-Propagating Melt in Amorphous Silicon upon Pulsed-Laser Irradiation

W Sinke, FW Saris - Physical Review Letters, 1984 - ui.adsabs.harvard.edu
A double-peak structure is observed in the Cu concentration profile after low-energy pulsed-
laser irradiation of Cu-implanted Si. From the Cu surface segregation a primary melt depth is …

[引用][C] Evidence for a Self-Propagating Melt in Amorphous Silicon upon Pulsed-Laser Irradiation

W Sinke, FW Saris - Physical Review Letters, 1984 - cir.nii.ac.jp
Evidence for a Self-Propagating Melt in Amorphous Silicon upon Pulsed-Laser Irradiation |
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