Calibration of a commercial AFM: traceability for a coordinate system

V Korpelainen, A Lassila - Measurement Science and …, 2007 - iopscience.iop.org
Traceability of measurements and calibration of devices are needed also at the nanometre
scale. Calibration of a commercial atomic force microscope (AFM) was studied as part of a …
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[引用][C] Calibration of a commercial AFM: Traceability for a coordinate system

V KORPELAINEN - Meas. Sci. Technol., 2007 - cir.nii.ac.jp
Calibration of a commercial AFM : Traceability for a coordinate system | CiNii Research
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[引用][C] Calibration of a commercial AFM: traceability for a coordinate system

V Korpelainen, A Lassila - Measurement Science and …, 2007 - researchportal.helsinki.fi
Calibration of a commercial AFM: traceability for a coordinate system — University of Helsinki
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Calibration of a commercial AFM: traceability for a coordinate system

V Korpelainen, A Lassila - Measurement Science and Technology, 2007 - cris.vtt.fi
Traceability of measurements and calibration of devices are needed also at the nanometre
scale. Calibration of a commercial atomic force microscope (AFM) was studied as part of a …

Calibration of a commercial AFM: traceability for a coordinate system

V Korpelainen, A Lassila - Measurement Science and …, 2007 - ui.adsabs.harvard.edu
Traceability of measurements and calibration of devices are needed also at the nanometre
scale. Calibration of a commercial atomic force microscope (AFM) was studied as part of a …

[引用][C] Calibration of a commercial AFM: Traceability for a coordinate system

V KORPELAINEN - Meas. Sci. Technol., 2007 - cir.nii.ac.jp

[引用][C] Calibration of a commercial AFM: traceability for a coordinate system

V KORPELAINEN, A LASSILA - Measurement science & …, 2007 - Institute of Physics