A novel atomic force microscope with high stability and scan speed

Y He, D Zhang, H Zhang - Instrumentation Science and …, 2006 - Taylor & Francis
A novel atomic force microscope (AFM) has been developed. Unlike conventional AFM
systems, its cantilever and tip were set up in the X direction with respect to the sample. It can …
被引用次数：5 相关文章

[引用][C] A Novel Atomic Force Microscope with High Stability and Scan Speed

Y He, D Zhang, H Zhang - Instrumentation Science & …, 2006 - ui.adsabs.harvard.edu
A Novel Atomic Force Microscope with High Stability and Scan Speed - NASA/ADS Now on
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[引用][C] A novel atomic force microscope with high stability and scan speed

Y HE, D ZHANG, H ZHANG - Instrumentation science & technology, 2006 - Taylor & Francis