A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer
DY Lee, DM Kim, DG Gweon, J Park - Applied surface science, 2007 - Elsevier
A compact and two-dimensional atomic force microscope (AFM) using an orthogonal sample
scanner, a calibrated homodyne laser interferometer and a commercial AFM head was …
scanner, a calibrated homodyne laser interferometer and a commercial AFM head was …
A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer
DY Lee, DM Kim, DG Gweon, J Park - Applied Surface Science, 2007 - inis.iaea.org
[en] A compact and two-dimensional atomic force microscope (AFM) using an orthogonal
sample scanner, a calibrated homodyne laser interferometer and a commercial AFM head …
sample scanner, a calibrated homodyne laser interferometer and a commercial AFM head …
A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer
DY Lee, DM Kim, DG Gweon, J Park - Applied Surface Science, 2007 - osti.gov
A compact and two-dimensional atomic force microscope (AFM) using an orthogonal sample
scanner, a calibrated homodyne laser interferometer and a commercial AFM head was …
scanner, a calibrated homodyne laser interferometer and a commercial AFM head was …
A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer
DY Lee, DM Kim, DG Gweon… - APPLIED SURFACE …, 2007 - koasas.kaist.ac.kr
A compact and two-dimensional atomic force microscope (AFM) using an orthogonal sample
scanner, a calibrated homodyne laser interferometer and a commercial AFM head was …
scanner, a calibrated homodyne laser interferometer and a commercial AFM head was …
A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer
DY Lee, DM Kim, DG Gweon, J Park - Applied Surface Science, 2007 - infona.pl
A compact and two-dimensional atomic force microscope (AFM) using an orthogonal sample
scanner, a calibrated homodyne laser interferometer and a commercial AFM head was …
scanner, a calibrated homodyne laser interferometer and a commercial AFM head was …
[引用][C] A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer
DY LEE, DM KIM, DG GWEON… - Applied surface …, 2007 - pascal-francis.inist.fr
A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser
interferometer CNRS Inist Pascal-Francis CNRS Pascal and Francis Bibliographic …
interferometer CNRS Inist Pascal-Francis CNRS Pascal and Francis Bibliographic …
A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer
DY Lee, DM Kim, DG Gweon… - Applied Surface …, 2007 - ui.adsabs.harvard.edu
A compact and two-dimensional atomic force microscope (AFM) using an orthogonal sample
scanner, a calibrated homodyne laser interferometer and a commercial AFM head was …
scanner, a calibrated homodyne laser interferometer and a commercial AFM head was …