Scanning Electrochemical Microscope Observation of Defects in a Hexadecanethiol Monolayer on Gold with Shear Force-Based Tip− Substrate Positioning
H Yamada, M Ogata, T Koike - Langmuir, 2006 - ACS Publications
Scanning electrochemical microscopy (SECM) was used for imaging of n-hexadecanethiol-
modified Au surfaces. In these studies, small defects were observed in the monolayer when …
modified Au surfaces. In these studies, small defects were observed in the monolayer when …
Scanning electrochemical microscope observation of defects in a hexadecanethiol monolayer on gold with shear force-based tip-substrate positioning.
H Yamada, M Ogata, T Koike - … : the ACS Journal of Surfaces and …, 2006 - europepmc.org
Scanning electrochemical microscopy (SECM) was used for imaging of n-hexadecanethiol-
modified Au surfaces. In these studies, small defects were observed in the monolayer when …
modified Au surfaces. In these studies, small defects were observed in the monolayer when …
Scanning electrochemical microscope observation of defects in a hexadecanethiol monolayer on gold with shear force-based tip-substrate positioning
H Yamada, M Ogata, T Koike - Langmuir: the ACS …, 2006 - pubmed.ncbi.nlm.nih.gov
Scanning electrochemical microscopy (SECM) was used for imaging of n-hexadecanethiol-
modified Au surfaces. In these studies, small defects were observed in the monolayer when …
modified Au surfaces. In these studies, small defects were observed in the monolayer when …
[引用][C] Scanning electrochemical microscope observation of defects in a hexadecanethiol monolayer on gold with shear force-based tip-substrate positioning
H YAMADA, M OGATA, T KOIKE - Langmuir, 2006 - pascal-francis.inist.fr
Scanning electrochemical microscope observation of defects in a hexadecanethiol
monolayer on gold with shear force-based tip-substrate positioning CNRS Inist Pascal-Francis …
monolayer on gold with shear force-based tip-substrate positioning CNRS Inist Pascal-Francis …
[引用][C] Scanning Electrochemical Microscope Observation of Defects in a Hexadecanethiol Monolayer on Gold with Shear Force-Based Tip− Substrate Positioning
H Yamada, M Ogata, T Koike - Langmuir, 2006 - cir.nii.ac.jp
Scanning Electrochemical Microscope Observation of Defects in a Hexadecanethiol Monolayer
on Gold with Shear Force-Based Tip−Substrate Positioning | CiNii Research CiNii 国立情報学 …
on Gold with Shear Force-Based Tip−Substrate Positioning | CiNii Research CiNii 国立情報学 …
[引用][C] Scanning Electrochemical Microscope Observation of Defects in a Hexadecanethiol Monolayer on Gold with Shear Force-Based Tip− Substrate Positioning
H Yamada, M Ogata, T Koike - Langmuir, 2006 - infona.pl
Scanning Electrochemical Microscope Observation of Defects in a Hexadecanethiol Monolayer
on Gold with Shear Force-Based Tip−Substrate Positioning × Close The Infona portal uses …
on Gold with Shear Force-Based Tip−Substrate Positioning × Close The Infona portal uses …