Traceability for nanometre scale measurements: Atomic force microscopes in dimensional nanometrology

V Korpelainen - 2014 - cris.vtt.fi
Reliability of measurement is a crucial element of both research and industry. Metrological
traceability to the SI unit metre guarantees commensurate units, also at nanometre range. In …
被引用次数：7 相关文章

Traceability for nanometre scale measurements: Atomic force microscopes in dimensional nanometrology

V Korpelainen - 2014 - helda.helsinki.fi
Reliability of measurement is a crucial element of both research and industry. Metrological
traceability to the SI unit metre guarantees commensurate units, also at nanometre range. In …