Multi-probe atomic force microscopy with optical beam deflection method

E Tsunemi, N Satoh, Y Miyato… - Japanese Journal of …, 2007 - iopscience.iop.org
We developed a multi-probe atomic force microscope (AFM) having two AFM cantilevers
independently controlled using the optical beam deflection method. We succeeded in …
被引用次数：21 相关文章

Multi-Probe Atomic Force Microscopy with Optical Beam Deflection Method

E Tsunemi, N Satoh, Y Miyato… - … Journal of Applied …, 2007 - ui.adsabs.harvard.edu
We developed a multi-probe atomic force microscope (AFM) having two AFM cantilevers
independently controlled using the optical beam deflection method. We succeeded in …

[引用][C] Multi‐probe atomic force microscopy with optical beam deflection method

E Tsunemi - Jpn J Appl Phys, 2007 - cir.nii.ac.jp
Multi‐probe atomic force microscopy with optical beam deflection method | CiNii Research
CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データを …

[引用][C] Multi-probe atomic force microscopy with optical beam deflection method

E Tsunemi, N Satoh, Y Miyato - Japanese journal of applied physics. Part …, 2007 - cir.nii.ac.jp
Multi-probe atomic force microscopy with optical beam deflection method | CiNii Research
CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データを …