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Traceable atomic force microscope dimensional metrology at NIST

R Dixson, NG Orji, J Fu, M Cresswell… - … Process Control for …, 2006 - spiedigitallibrary.org
The National Institute of Standards and Technology (NIST) has a multifaceted program in
atomic force microscope (AFM) dimensional metrology. There are two major instruments …
被引用次数：33 相关文章

[引用][C] Traceable atomic force microscope dimensional metrology at NIST

R DIXSON, NG ORJI, J FU… - … of SPIE, the …, 2006 - pascal-francis.inist.fr
Traceable atomic force microscope dimensional metrology at NIST CNRS Inist Pascal-Francis
CNRS Pascal and Francis Bibliographic Databases Simple search Advanced search Search by …

[引用][C] Traceable atomic force microscope dimensional metrology at NIST

R DIXSON - Proc. SPIE, 2006 - cir.nii.ac.jp

Traceable atomic force microscope dimensional metrology at NIST

R Dixson, NG Orji, J Fu, M Cresswell… - … Process Control for …, 2006 - ui.adsabs.harvard.edu
Abstract The National Institute of Standards and Technology (NIST) has a multifaceted
program in atomic force microscope (AFM) dimensional metrology. There are two major …

Traceable Atomic Force Microscope Dimensional Metrology at NIST

RG Dixson, NG Orji, J Fu, MW Cresswell, RA Allen… - 2006 - nist.gov
Abstract The National Institute of Standards and Technology (NIST) has a multifaceted
program in atomic force microscope (AFM) dimensional metrology. There are two major …

Traceable atomic force microscope dimensional metrology at NIST

R Dixson, N Orji, J Fu, M Cresswell, R Allen - Proc. of SPIE Vol - spiedigitallibrary.org
ABSTRACT The National Institute of Standards and Technology (NIST) has a multifaceted
program in atomic force microscope (AFM) dimensional metrology. There are two major …

Traceable Atomic Force Microscope Dimensional Metrology at NIST

RG Dixson, NG Orji, J Fu, MW Cresswell, RA Allen… - 2006 - nist.gov
Abstract The National Institute of Standards and Technology (NIST) has a multifaceted
program in atomic force microscope (AFM) dimensional metrology. There are two major …

[引用][C] Traceable atomic force microscope dimensional metrology at NIST

R Dixson, NG Orji, J Fu, M Cresswell, R Allen… - SPIE …, 2006 - cir.nii.ac.jp
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