… Three-Independent-Gate (TIG)-RFET structure with pure SiGe channel. a) A 3D sketch illustrating … If a negative back-bias voltage is applied, the entire semiconductor bands are shifted …
… The structure consists of an ultrathin \({\mathrm{SiO}}_2\) layer over the p-Si region placed on the BOX. The various devicestructural parameters used in this study are: gate oxide (GOX) …
… The Si trigate structure analyzed in this brief has a rectangular cross-sectional channel, being Ws and Hs the semiconductor width and height, and tins = 1.2 nm and tbox = 10 nm the …
DH Jung, KS Lee, JY Park - JOURNAL OF SEMICONDUCTOR …, 2021 - journal.auric.kr
… When back-bias of 15 V is applied through the bottom silicon substrate, the voltage is gradually distributed … His current research interests include reliability of semiconductordevices. …
… of standard FD devices-based structure. In … backbias applied to both n- or p-type devices. Finally, it is shown that the mirroring precision of current mirrors composed by SC structures …
J Jeong, SK Kim, J Kim, DM Geum… - IEEE Electron Device …, 2023 - ieeexplore.ieee.org
… The fT maps of 3D stacked InGaAs HEMT with back metal line for (a) negative backbias, (b) zero backbias, and (c) positive backbias. The fMAX maps of 3D stacked InGaAs HEMT with …
Y Qian, Q Liu, J Yao, X Wang, AK Shukla… - … the Electron Devices …, 2023 - ieeexplore.ieee.org
… It increases when the devicestructure evolves more towards pure GAA device for high performance; and meanwhile the modulation capability of Idlin decreases as manifested by the …
W Chen, L Cai, X Liu, G Du - … Transactions on Electron Devices, 2020 - ieeexplore.ieee.org
… in the ultrascaled FDSOI device, taking the impact of gate area scaling as well as quantum effects into account. It also facilitates the evaluation of backbias effectiveness variability …
M Cassé, BC Paz, G Ghibaudo… - … on Electron Devices, 2020 - ieeexplore.ieee.org
… backbias VB at room temperature and at 4.2 K, on the same transistor as in (a). The back bias … Ghibaudo, “Physics and performance of nanoscale semiconductordevices at cryogenic …