Impact of Ground Plane Doping and Bottom-Gate Biasing on Electrical Properties in In0.53Ga0.47As-OI MOSFETs and Donor Wafer Reusability Toward Monolithic 3-D Integration With In …

SK Kim, JP Shim, DM Geum, J Kim… - … on Electron Devices, 2018 - ieeexplore.ieee.org
… 2(a) shows a schematic of the device structure and the fabrication process flow. To fabricate
… 47As-oninsulator on Si for monolithic 3D via novel epitaxial lift-off (ELO) and donor wafer re-…

BackBias Effects in a SiGe Nanosheet Transistor with Multiple Independent Gates

C Beyer, N Bhattacharjee, T Mikolaijck… - Advanced Materials … - Wiley Online Library
… Three-Independent-Gate (TIG)-RFET structure with pure SiGe channel. a) A 3D sketch
illustrating … If a negative back-bias voltage is applied, the entire semiconductor bands are shifted …

Controlling the ambipolar current in ultrathin SOI tunnel FETs using the back-bias effect

T Joshi, B Singh, Y Singh - Journal of Computational Electronics, 2020 - Springer
… The structure consists of an ultrathin \({\mathrm{SiO}}_2\) layer over the p-Si region placed
on the BOX. The various device structural parameters used in this study are: gate oxide (GOX) …

Impact of the back-gate biasing on trigate MOSFET electron mobility

EG Marin, FG Ruiz, A Godoy… - … on Electron Devices, 2014 - ieeexplore.ieee.org
… The Si trigate structure analyzed in this brief has a rectangular cross-sectional channel,
being Ws and Hs the semiconductor width and height, and tins = 1.2 nm and tbox = 10 nm the …

[PDF][PDF] Demonstration of Multi-layered Macaroni Filler for Back-Biasing-Assisted Erasing Configuration in 3D V-NAND

DH Jung, KS Lee, JY Park - JOURNAL OF SEMICONDUCTOR …, 2021 - journal.auric.kr
… When back-bias of 15 V is applied through the bottom silicon substrate, the voltage is
gradually distributed … His current research interests include reliability of semiconductor devices. …

Effect of the back bias on the analog performance of standard FD and UTBB transistors-based self-cascode structures

RT Doria, D Flandre, R Trevisoli… - Semiconductor …, 2017 - iopscience.iop.org
… of standard FD devices-based structure. In … back bias applied to both n- or p-type devices.
Finally, it is shown that the mirroring precision of current mirrors composed by SC structures

Effects of back metal on the DC and RF characteristics of 3D stacked InGaAs RF device for monolithic 3D RF applications

J Jeong, SK Kim, J Kim, DM Geum… - IEEE Electron Device …, 2023 - ieeexplore.ieee.org
… The fT maps of 3D stacked InGaAs HEMT with back metal line for (a) negative back bias, (b)
zero back bias, and (c) positive back bias. The fMAX maps of 3D stacked InGaAs HEMT with …

Compensation of Hot Carrier Degradation Enabled by Forward Back Bias in π-GAA-π MOSFET

Y Qian, Q Liu, J Yao, X Wang, AK Shukla… - … the Electron Devices …, 2023 - ieeexplore.ieee.org
… It increases when the device structure evolves more towards pure GAA device for high
performance; and meanwhile the modulation capability of Idlin decreases as manifested by the …

Analytical model for interface traps-dependent back bias capability and variability in ultrathin body and box fdsoi mosfets

W Chen, L Cai, X Liu, G Du - … Transactions on Electron Devices, 2020 - ieeexplore.ieee.org
… in the ultrascaled FDSOI device, taking the impact of gate area scaling as well as
quantum effects into account. It also facilitates the evaluation of back bias effectiveness variability …

Cryogenic operation of thin-film FDSOI nMOS transistors: The effect of back bias on drain current and transconductance

M Cassé, BC Paz, G Ghibaudo… - … on Electron Devices, 2020 - ieeexplore.ieee.org
back bias VB at room temperature and at 4.2 K, on the same transistor as in (a). The back
bias … Ghibaudo, “Physics and performance of nanoscale semiconductor devices at cryogenic …