technique has been investigated. Thin films produced by this method have been characterized using X-ray diffractometry (XRD), X-ray photoelectron spectroscopy (XPS), electron diffractometry and analytical scanning electron microscopy (SEM).
Abstract
The possibility of dicadmium stannate thin film production using a vacuum evaporation technique has been investigated. Thin films produced by this method have been characterized using X-ray diffractometry (XRD), X-ray photoelectron spectroscopy (XPS), electron diffractometry and analytical scanning electron microscopy (SEM).