Analysis and calibration of process variations for an array of temperature sensors
2017 IEEE SENSORS, 2017•ieeexplore.ieee.org
This paper presents an analysis and calibration of process variations for an array of
temperature sensors, which are incorporated into a CMOS image sensor chip. Making use of
the experimental results of more than 500 temperature sensors implemented on the same
chip, the proposed calibration method has removed their process variations from 14.3% to
2.5%(3 sigma).
temperature sensors, which are incorporated into a CMOS image sensor chip. Making use of
the experimental results of more than 500 temperature sensors implemented on the same
chip, the proposed calibration method has removed their process variations from 14.3% to
2.5%(3 sigma).
This paper presents an analysis and calibration of process variations for an array of temperature sensors, which are incorporated into a CMOS image sensor chip. Making use of the experimental results of more than 500 temperature sensors implemented on the same chip, the proposed calibration method has removed their process variations from 14.3 % to 2.5 % (3 sigma).
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