Atomically precise impurity identification and modification on the manganese doped GaAs (110) surface with scanning tunneling microscopy

JK Garleff, C Çelebi, W Van Roy, JM Tang… - Physical Review B …, 2008 - APS
JK Garleff, C Çelebi, W Van Roy, JM Tang, ME Flatté, PM Koenraad
Physical Review B—Condensed Matter and Materials Physics, 2008APS
Cross-sectional scanning tunneling microscopy (STM) measurements on molecular beam
epitaxy grown Mn doped GaAs (110) at 5 and 77 K are presented. The enhanced
mechanical stability of the STM at low temperature allows a detailed study of the electronic
contrast of Mn atoms in the GaAs (110) surface. According to reproducible and
distinguishable contrast patterns of single Mn atoms, we present statistical evidence for a
layer by layer identification of Mn atoms embedded in the first few monatomic layers of the …
Cross-sectional scanning tunneling microscopy (STM) measurements on molecular beam epitaxy grown Mn doped GaAs(110) at 5 and 77 K are presented. The enhanced mechanical stability of the STM at low temperature allows a detailed study of the electronic contrast of Mn atoms in the GaAs(110) surface. According to reproducible and distinguishable contrast patterns of single Mn atoms, we present statistical evidence for a layer by layer identification of Mn atoms embedded in the first few monatomic layers of the crystal. A comparison with a bulklike theoretical approach reveals a semiquantitative agreement with the measurements. Remaining differences between theory and experiment indicate the influence of the surface as an important factor to understand the contrast of impurities close to the surface. Furthermore, we report the injection of transition-metal atoms into the surface. Finally, reproducible complexes consisting of a surface Mn and an adsorbate atom are found and manipulated.
American Physical Society
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