Automatic scan insertion and test generation for asynchronous circuits
FT Beest, A Peeters, M Verra… - Proceedings …, 2002 - ieeexplore.ieee.org
FT Beest, A Peeters, M Verra, K van Berkel, H Kerkhoff
Proceedings. International Test Conference, 2002•ieeexplore.ieee.orgA test method for asynchronous handshake circuits is presented that is based on
synchronous full-scan techniques. The method adds a synchronous test mode to the circuit,
in which the entire circuit is controlled by external clocks. This enables the use of
conventional test generation tools. The method resulted in an operational flow, capable of
automatically testing any handshake circuit with test-quality equal to synchronous circuits.
Several circuits have been evaluated, demonstrating over 99% stuck-at fault coverage.
synchronous full-scan techniques. The method adds a synchronous test mode to the circuit,
in which the entire circuit is controlled by external clocks. This enables the use of
conventional test generation tools. The method resulted in an operational flow, capable of
automatically testing any handshake circuit with test-quality equal to synchronous circuits.
Several circuits have been evaluated, demonstrating over 99% stuck-at fault coverage.
A test method for asynchronous handshake circuits is presented that is based on synchronous full-scan techniques. The method adds a synchronous test mode to the circuit, in which the entire circuit is controlled by external clocks. This enables the use of conventional test generation tools. The method resulted in an operational flow, capable of automatically testing any handshake circuit with test-quality equal to synchronous circuits. Several circuits have been evaluated, demonstrating over 99% stuck-at fault coverage.
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