Bulk and surface contributions to second-order susceptibility in crystalline and porous silicon by second-harmonic generation
M Falasconi, LC Andreani, AM Malvezzi, M Patrini… - Surface Science, 2001 - Elsevier
Accurate second-harmonic generation (SHG) measurements in reflection on native-oxide-
covered porous silicon samples and on (100) p-type doped crystalline silicon wafers have
been performed. Non-linear reflection coefficients of both materials have been measured as
a function of the azimuthal angle around the direction normal to the surface. An absolute
calibration has been performed to allow a quantitative analysis of second-harmonic
efficiencies. Following the theory of SHG in reflection in centrosymmetric media, surface and …
covered porous silicon samples and on (100) p-type doped crystalline silicon wafers have
been performed. Non-linear reflection coefficients of both materials have been measured as
a function of the azimuthal angle around the direction normal to the surface. An absolute
calibration has been performed to allow a quantitative analysis of second-harmonic
efficiencies. Following the theory of SHG in reflection in centrosymmetric media, surface and …
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