Characterizing ultrathin and thick organic layers by surface plasmon resonance three-wavelength and waveguide mode analysis
A three-wavelength angular-scanning surface plasmon resonance based analysis has been
utilized for characterizing optical properties of organic nanometer-thick layers with a wide
range of thicknesses. The thickness and refractive index were determined for sample layers
with thicknesses ranging from subnanometer to hundreds of nanometers. The analysis
approach allows for simultaneous determination of both the refractive index and thickness
without prior knowledge of either the refractive index or the thickness of the sample layers …
utilized for characterizing optical properties of organic nanometer-thick layers with a wide
range of thicknesses. The thickness and refractive index were determined for sample layers
with thicknesses ranging from subnanometer to hundreds of nanometers. The analysis
approach allows for simultaneous determination of both the refractive index and thickness
without prior knowledge of either the refractive index or the thickness of the sample layers …
[引用][C] Characterizing Ultrathin and Thick Organic Layers by Surface Plasmon Resonance Three-Wavelength and Waveguide Mode Analysis
G Niko, L Huamin, L Terhi, S Janusz, Y Marjo, V Tapani - 2013
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