X-ray photoemission electron microscopy, one of the most successful imaging tools at
synchrotrons, is known to have limitations related to the application of external fields and to
the short electron mean free path. In order to overcome such issues, we adapt an existing
XPEEM instrument to simultaneously perform coherent x-ray scattering measurements in
reflectivity mode, thus adding a complementary method to XPEEM. Photon-in photon-out x-
ray scattering provides the sensitivity to buried interfaces as well as the possibility to work …