air-annealed ZnO single crystal samples for annealing temperatures up to 1000° C. Atomic
Force Microscopy (AFM) showed temperature-dependent changes in surface roughness
and morphology, with a maximum in surface roughness of 2nm found for samples annealed
at 400° C. The O (1s) line, measured by X-ray Photoelectron Spectroscopy (XPS) showed a
maximum for Zn (OH) 2 and a minimum for off-stoichiometric ZnO at 400° C; while the Zn …