Data analysis of interaction forces measured with the atomic force microscope
W Baumgartner, P Hinterdorfer, H Schindler - Ultramicroscopy, 2000 - Elsevier
The force-distance cycle mode of the atomic force microscope (AFM) allows for detection of
interaction forces between the AFM-tip and a substrate (probe). This can either be a direct tip–
sample interaction or an interaction between molecules coupled to the tip and probe,
respectively. The interaction forces are typically in the range of a few pN to some hundred
pN. In this article we describe algorithms for the analysis of force–distance cycles, to quantify
interaction forces between tip and probe. Both, the direct tip–probe interaction as well as the …
interaction forces between the AFM-tip and a substrate (probe). This can either be a direct tip–
sample interaction or an interaction between molecules coupled to the tip and probe,
respectively. The interaction forces are typically in the range of a few pN to some hundred
pN. In this article we describe algorithms for the analysis of force–distance cycles, to quantify
interaction forces between tip and probe. Both, the direct tip–probe interaction as well as the …