fabricated by sol–gel spin coating and annealed under 500° C. The films are composed of
hexagonal wurtzite ZnO and tetragonal rutile SnO 2 without compound impurities. With
increasing the Zn/Sn molar ratio, the growth of SnO 2 grain is inhibited, while that of the ZnO
is promoted. The film transmittance decreases for higher Zn/Sn ratio due to scattering losses
caused by pinhole and island growth in the film surface. We show that the film electrical …