We focused on the electromagnetic interference shielding effectiveness of multi-layer thin
films, which were composed of Cu and NiFe, fabricated by direct current magnetron
sputtering. Crystal structures and microstructures of the multi-layer thin films were confirmed
through X-ray diffraction and field emission transmittance electron microscopy. In addition,
the magnetic properties of the multi-layer thin films and pure NiFe thin films were measured
by using a vibration sample magnetometer and vector network analyzer. To improve the …