Electron refraction in ballistic electron-emission microscopy studied by a superlattice energy filter

J Smoliner, R Heer, C Eder, G Strasser - Physical Review B, 1998 - APS
Physical Review B, 1998APS
Abstract Buried Al 0.4 Ga 0.6 A s/G a A s superlattices on Au-GaAs Schottky diodes have
been used as an energy filter to study the energetic current distribution in ballistic electron-
emission microscopy (BEEM) at room temperature and T= 100 K. Due to the large difference
in electron masses in Au and GaAs we find that parallel momentum conservation leads to
considerable electron refraction at the Au-GaAs interface. As a consequence, the energetic
distribution of the ballistic electron current is inverted beyond the Au-GaAs interface and an …
Abstract
Buried Al 0.4 Ga 0.6 A s/G a A s superlattices on Au-GaAs Schottky diodes have been used as an energy filter to study the energetic current distribution in ballistic electron-emission microscopy (BEEM) at room temperature and T= 100 K. Due to the large difference in electron masses in Au and GaAs we find that parallel momentum conservation leads to considerable electron refraction at the Au-GaAs interface. As a consequence, the energetic distribution of the ballistic electron current is inverted beyond the Au-GaAs interface and an almost linear behavior of the BEEM spectrum is observed in the energetic regime of the superlattice miniband.
American Physical Society
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