(Ga 69.75 La 29.75 Er 0.5) 2 S 300 single crystals synthesized by solution-melt technique. In
particular, X-ray photoelectron spectroscopy (XPS) was used to measure core-level binding
energies and valence-band spectra for as-synthesized and Ar+ ion-irradiated surfaces of
these crystals. Presented XPS measurements show that the (Ga 70 La 30) 2 S 300 and (Ga
69.75 La 29.75 Er 0.5) 2 S 300 single crystals are rather stable in relation to Ar+ ion …