Aging monitors can indicate the wear-out phase of a semi-conductor device before it will actually fail, and allow the use of integrated circuits in applications with high safety and reliability demands. In the early phase of the lifecycle of integrated systems, small delay faults may indicate reliability problems and early life failures, even if they are smaller than the slack of any path and neither alter the functional behavior of a system nor violate any aging guardband. One option to detect this type of hidden delay faults (HDFs) is the application of a faster-than-at-speed-test (FAST). This paper shows that aging monitors can be extended at low cost to achieve high HDF test coverage with a reduction in test time during FAST. The result is a unified strategy to improve the reliability in both early and late phases of the system lifecycle.