High resolution optical frequency domain reflectometry for measurement of waveguide group refractive index
D Zhao, D Pustakhod, K Williams… - 2017 IEEE Photonics …, 2017 - ieeexplore.ieee.org
D Zhao, D Pustakhod, K Williams, X Leijtens
2017 IEEE Photonics Conference (IPC), 2017•ieeexplore.ieee.orgWe present a high-resolution optical frequency domain reflectometry for characterization of
group refractive index of waveguides in photonic integrated circuits. The method provides a
relative accuracy of 10-4 for group refractive index measurements and of 10-3 for its
dispersion.
group refractive index of waveguides in photonic integrated circuits. The method provides a
relative accuracy of 10-4 for group refractive index measurements and of 10-3 for its
dispersion.
We present a high-resolution optical frequency domain reflectometry for characterization of group refractive index of waveguides in photonic integrated circuits. The method provides a relative accuracy of 10 -4 for group refractive index measurements and of 10 -3 for its dispersion.
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