[PDF][PDF] Inspection in semiconductor manufacturing

KW Tobin - Webster's Encyclopedia of Electrical and Electronic …, 1999 - Citeseer
… At an inspection point, of which there are several in the process stream, a fraction of the
wafers will be inspected, typically on the order of 20%. The fraction of wafers inspected depends …

Enhancing manual inspection in semiconductor manufacturing with integrated augmented reality solutions

CH Chu, CY Weng, YT Chen - Journal of Manufacturing Systems, 2024 - Elsevier
… an AR headset during the inspection process at the location. … inspection efficiency and
quality by reducing human workloads. This work demonstrates that semiconductor manufacturing

A literature review on sampling techniques in semiconductor manufacturing

J Nduhura-Munga, G Rodriguez-Verjan… - … on Semiconductor …, 2013 - ieeexplore.ieee.org
… defect inspection, critical dimensions, overlay, thickness, or step height measurements) in
semiconductor manufacturing. We will discuss the trade-off between the cost of inspection and …

Improving SEM inspection performance in semiconductor manufacturing industry

CL Lin, FS Chen, LJ Twu… - … in Manufacturing & …, 2014 - Wiley Online Library
… Twelve female SEM inspectors from a semiconductor company participated in this study. Their
manufacturing lab, the average year was 6.8. The average experience in SEM inspection

Automated visual inspection in the semiconductor industry: A survey

SH Huang, YC Pan - Computers in industry, 2015 - Elsevier
inspection approaches in the semiconductor industry and categorize the previous literatures
by the inspection algorithm and inspected … in the semiconductor manufacturing industry. The …

Improving automated visual fault inspection for semiconductor manufacturing using a hybrid multistage system of deep neural networks

T Schlosser, M Friedrich, F Beuth… - … of Intelligent Manufacturing, 2022 - Springer
semiconductor industry, automated visual inspection aims to improve the detection and
recognition of manufacturing … increased yield and reduced manufacturing costs. Previous domain-…

A new strategy for defect inspection by the virtual inspection in semiconductor wafer fabrication

JCH Pan, DHE Tai - Computers & Industrial Engineering, 2011 - Elsevier
… virtual inspection (VI) to enhance the detection and monitoring of defect in semiconductor
production … of typical control systems in the semiconductor manufacturing, such as MES, defect …

Bayesian decision analysis for optimizing in-line metrology and defect inspection strategy for sustainable semiconductor manufacturing and an empirical study

CF Chien, TH Van Nguyen, YC Li, YJ Chen - Computers & Industrial …, 2023 - Elsevier
… and maintaining competitive advantages of semiconductor companies. Indeed, semiconductor
manufacturing companies used to employ static sampling inspection plan with defined …

Integrated applications of inspection data in the semiconductor manufacturing environment

KW Tobin Jr, TP Karnowski… - … for Micro-Manufacturing, 2001 - spiedigitallibrary.org
… MANAGEMENT Semiconductormanufactured. Yield management can be defined as the
management and analysis of data and information from semiconductor process and inspection

The role of metrology and inspection in semiconductor processing

M Keefer, R Pinto, C Dennison, J Turlo - Handbook of Thin Film Deposition …, 2001 - Elsevier
… and wafer inspection for defects are integral to controlling the semiconductor manufacturing
manufacturing process, then later to ensure that it is operating under control. Metrology and …