grown on GaAs (001) is governed by the two-dimensional (2D), periodic interfacial misfit
(IMF) dislocation array growth mode. Under optimized growth conditions, only pure 90
dislocations are generated along both [110] and [1 1 0] directions that are located at
GaSb/GaAs interface, which leads to very low threading dislocation density propagated
along the growth direction. The long-range uniformity and subsequent strain relaxation of …