Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope
OV Snigirev, KE Andreev, AM Tishin, SA Gudoshnikov… - Physical Review B, 1997 - APS
Physical Review B, 1997•APS
We have applied a scanning HTS (high-temperature superconductor) dc SQUID
(superconducting quantum interference device)-based magnetic microscope to study the
magnetic properties of Au/Ni/Si (100) films in the thickness range from 8 to 200 Å at T= 77 K.
A one-domain structure with in-plane orientation of the magnetic moment was found for film
thicknesses exceeding 26 Å. A drastic decrease of the magnetization of the film was
detected when the thickness is less than 26 Å.
(superconducting quantum interference device)-based magnetic microscope to study the
magnetic properties of Au/Ni/Si (100) films in the thickness range from 8 to 200 Å at T= 77 K.
A one-domain structure with in-plane orientation of the magnetic moment was found for film
thicknesses exceeding 26 Å. A drastic decrease of the magnetization of the film was
detected when the thickness is less than 26 Å.
Abstract
We have applied a scanning HTS (high-temperature superconductor) dc SQUID (superconducting quantum interference device)-based magnetic microscope to study the magnetic properties of Au/Ni/Si (100) films in the thickness range from 8 to 200 Å at T= 77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Å. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Å.
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