Cu) and 1 mol% Al were fabricated as a series of oxide-diluted magnetic semiconductors by
pulsed-laser-deposition method. Magnetoresistance (MR) of the films was measured to
investigate the s–d exchange interaction between the conducting s electron spins and the d
electron spins localized at the magnetic TM impurities. A variety of MR behaviors were
observed depending on the different TM impurities. It is deduced that the negative MR …