Metallized film capacitors degradation under high electrodynamic load
VO Belko, OA Emelyanov, IO Ivanov… - … IEEE Conference of …, 2017 - ieeexplore.ieee.org
2017 IEEE Conference of Russian Young Researchers in Electrical …, 2017•ieeexplore.ieee.org
Degradation process of metallized film capacitors under high electrodynamic load was
investigated. Pulse current overload factor exceeded 40. The polar effect of contact edges
destruction was found. The average lifetime of different metallized film capacitors in pulse
mode was evaluated. Dielectric frequency response testing during a capacitor's degradation
was performed. Obtained spectra contain a loss peaks in a range of 1-100 kHz which move
to lower frequencies region along with increasing of current pulse number. Possible reasons …
investigated. Pulse current overload factor exceeded 40. The polar effect of contact edges
destruction was found. The average lifetime of different metallized film capacitors in pulse
mode was evaluated. Dielectric frequency response testing during a capacitor's degradation
was performed. Obtained spectra contain a loss peaks in a range of 1-100 kHz which move
to lower frequencies region along with increasing of current pulse number. Possible reasons …
Degradation process of metallized film capacitors under high electrodynamic load was investigated. Pulse current overload factor exceeded 40. The polar effect of contact edges destruction was found. The average lifetime of different metallized film capacitors in pulse mode was evaluated. Dielectric frequency response testing during a capacitor's degradation was performed. Obtained spectra contain a loss peaks in a range of 1-100 kHz which move to lower frequencies region along with increasing of current pulse number. Possible reasons of such behavior are discussed.
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