Scaling challenges for advanced CMOS devices

AP Jacob, R Xie, MG Sung, L Liebmann… - … Journal of High …, 2017 - World Scientific
… Impressive advancements in semiconductor process integration … The fin sidewall angle also
impacts the finFET performancemeans, the fin cut has to be done after the isolation process, …

Development of a fully-depleted thin-body FinFET process

B Curanovic - 2003 - repository.rit.edu
fin width must be sublithographic, necessitating novel means … as pillars of semiconductor
surrounded by a gate, vertical … -etched trench for different etch techniques, post-etch treatments, …

What is killing Moore's law? Challenges in advanced FinFET technology integration

A Malinowski, J Chen, SK Mishra… - 2019 MIXDES-26th …, 2019 - ieeexplore.ieee.org
… Wafers in a semiconductor manufacturing process are … process with atomic layer deposition
(ALD) technique. However, … both conditions concurrently for the duration of the etch process, …

[图书][B] The design, fabrication and characterization of independent-gate finfets

DM Fried - 2004 - search.proquest.com
… Fabrication process cf a FinFET (a) The fin is etched in SOI. (… the benefits of DG-CMOS for
performance [15-23]. A … fully depleted semiconductor would not provide means for adjusting …

Progress and Prospects of InAs-Based FinFETs From Process Optimization to Device Architectural Innovation

Y Wang, Y Meng, Y Zhang, M Luo… - … on Electron Devices, 2024 - ieeexplore.ieee.org
techniques and architectural designs of InAs-based FinFETs, … of the InAs-based semiconductor
surface to create a thin … is the RF-ID technology, which combines concurrent I–V and S-…

An assessment of critical dimension small angle x-ray scattering metrology for advanced semiconductor manufacturing

CM Settens - 2015 - osti.gov
… for alternating Si fin lines beneath etched a-Si gates with a nominal … and will have an impact
on device electrical performance. All … Simultaneous migration of planar transistors to FinFET

Self-aligned single diffusion break technology optimization through material engineering for advanced CMOS nodes

A Pal, EM Bazizi, L Jiang, M Saremi… - … of Semiconductor …, 2020 - ieeexplore.ieee.org
… enabling simultaneous area0scaling and circuit and variability … (a) FinFET process flow used
in TCAD process simulation … effectiveness of this method (Fig. 6a). A compressive stress in …

Analog/mixed-signal design challenges in 7-nm CMOS and beyond

ALS Loke, D Yang, TT Wee, JL Holland… - 2018 IEEE Custom …, 2018 - ieeexplore.ieee.org
… -edge finFET nodes must cope with the complications of design concurrent with technology
… surrounding regions with techniques such as source/drain fin epitaxy and gate stress. The …

Important Considerations Regarding Device Parameter Process Variations in Semiconductor-Based Manufacturing

M Huff - ECS Journal of Solid State Science and Technology, 2021 - iopscience.iop.org
… use of semiconductor-based manufacturing methods in order … A FinFET is a non-planar
metal-oxide semiconductor (MOS) … of substrates can be concurrently involved in manufacturing, …

Study of finfet transistor. Critical and literature review in finfet transistor in the active filter

MA Ahmed, MZ Khalaf, D Hüseyin - 3 c TIC: cuadernos de …, 2023 - dialnet.unirioja.es
… planar double gate semiconductors, quasi-planar FinFET is … of given series, both lead to
the concurrent resistive loss. … We believe that employing the FinFET technique to improve …