… This paper reports on recent upgrades to the database to make the information more … This
database will initially contain x-ray photoelectron spectra and Auger electron spectra for many …

… A description is given of data resources that are available from the National Institute of …
Technology (NIST) for X-ray photoelectron spectroscopy (XPS) and Auger-electron spectroscopy. …

… sessa (Simulation of Electron Spectra for Surface Analysis) is a software that was frequently
… as entire spectral regions for photoelectron spectroscopy. X-ray photoelectron spectra can …

… (NIST) launched the first web version of its X-ray Photoelectron Spectroscopy (XPS) database
… This database was recently redesigned to meet NIST security requirements and to include …

… of the NIST X-ray Photoelectron Spectroscopy Database has … database will be cross-referenced
with other NIST Web data systems and will include additional critically evaluated data …

… X-ray photoelectron spectroscopy (XPS) or electron spectroscopy for chemical analysis (…
, NIST has developed a number of data products for application in XPS. Four databases are …

… A brief description is given of four databases issued by the … (NIST) for applications in surface
analysis by Auger-electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS)…

… X-ray photoelectron spectroscopy (XPS) is a widely employed technique in both industrial
and academic research with a unique capability of determining the chemical and electronic …

… of this database is to facilitate quantitative interpretation of Auger-electron and X-ray
photoelectron spectra (… For this purpose, the database contains physical data required to perform …

… Examples of line entries found for silicon using the chemical shiR option of the NIST X-ray
Photoelectron Spectroscopy Database. The suffix 'c' indicates a calculated chemical shift. The …