of open circuit voltage (V OC) which is mainly due to the easy formation of Cu Zn antisite
defects. Suppression of Cu Zn defects is thus inevitably required for further developments in
CZTS based solar cells. We studied systematic increase of Ag doping in CZTS thin film and
investigated the nanoscale electrical properties using Kelvin probe force microscopy and
current sensing atomic force microscopy (CAFM) to probe Cu Zn defects. Crystallographic …