We demonstrated near-field light detection by dynamic force microscope using a self-
sensing piezoelectric cantilever having a lead zirconate titanate thin film layer. The
cantilever tip was brought close to a glass plate with a patterned chromium film on a right
angle prism. The backside of the prism was irradiated by an intensity modulated laser light to
create an evanescent field at the glass surface. We obtained near-field optical images of the
patterned glass by detecting the frequency shift modulation or the amplitude modulation …