Neural network based technique for detecting catastrophic and parametric faults in analog circuits
SG Mosin - … Conference on Systems Engineering (ICSEng'05), 2005 - ieeexplore.ieee.org
18th International Conference on Systems Engineering (ICSEng'05), 2005•ieeexplore.ieee.org
The approach to transient functional test of analog circuits is considered. The artificial neural
network is proposed for realization of the circuit under test (CUT) response analysis. The
coefficients of wavelet decomposition of CUT transient output responses reflecting the
dynamical behavior of analog circuit are used for neural network training sensitivity analysis
is applied for selecting the test frequencies and test nodes. The experimental results for
analog benchmark circuits are provided.
network is proposed for realization of the circuit under test (CUT) response analysis. The
coefficients of wavelet decomposition of CUT transient output responses reflecting the
dynamical behavior of analog circuit are used for neural network training sensitivity analysis
is applied for selecting the test frequencies and test nodes. The experimental results for
analog benchmark circuits are provided.
The approach to transient functional test of analog circuits is considered. The artificial neural network is proposed for realization of the circuit under test (CUT) response analysis. The coefficients of wavelet decomposition of CUT transient output responses reflecting the dynamical behavior of analog circuit are used for neural network training sensitivity analysis is applied for selecting the test frequencies and test nodes. The experimental results for analog benchmark circuits are provided.
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