Non-contact dynamic mode atomic force microscope: Effects of nonlinear atomic forces

S Das, PA Sreeram, AK Raychaudhuri… - … IEEE Conference on …, 2006 - ieeexplore.ieee.org
We present an experimental investigation of the variation of the amplitude of vibrating
microcantilever, as a function of distance (h) between the microcantilever and the sample in
a Dynamic Force Microscopy (DFM) and explain the observations with a theoretical model.
In DFM, as the cantilever tip approaches the sample, neither the force nor the response of
the cantilever is in the linear regime. We present an exact numerical solution to the equation
of motion of the oscillations of the microcantilever and present a quantitative explanation to …

[引用][C] Non-Contact Dynamic Mode Atomic Force Microscope: Effects of nonlinear atomic forces, Emerging Technologies-Nanoelectronics

S Das, PA Sreeram, AK Raychaudhuri… - 2006 IEEE Conference on
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