scattering processes in the anomalous Hall effect. The result clearly exposed the
fundamental flaws of the conventional scaling ρ AH= f (ρ xx) between the anomalous Hall
resistivity and longitudinal resistivity. A new scaling ρ AH= f (ρ xx 0, ρ xx) that also involves
the residual resistivity has been established which helps identify the intrinsic and extrinsic
mechanisms of the anomalous Hall effect.