The authors report measurement of the radio‐frequency (RF) transport electromagnetic properties of chemical vapour deposition graphene over the direct current (DC) to 110 MHz frequency range at room temperature. Graphene on Si/SiO₂ substrate was mounted in a shielded four terminal‐pair (4TP) adaptor which enabled direct connection to a calibrated precision impedance analyser for measurements. Good agreement is observed for the DC four‐probe resistance and the 4TP resistance at 40 Hz, both yielding R ≈ 104 Ω. In general, the apparent graphene channel electromagnetic properties are found to be strongly influenced by the substrate parasitic capacitance and resistance, particularly for high‐frequencies f > 1 MHz. A phenomenological lumped‐parameter equivalent circuit model is presented which matches the frequency response of the graphene 4TP impedance device over approximately seven decades of the frequency range of the applied transport alternating current. Based on this model, it is shown for the first time, that the intrinsic graphene channel resistance of the 4TP device is ‘frequency‐independent’ with R_G ≃ 105 Ω or sheet resistance of approximately 182 Ω/□. The parasitic substrate impedance of the device is found to be R_P ≃ 2.2 Ω and C_P ≃ 600 pF. These results suggest that our new RF 4TP method is in good agreement with the conventional DC four‐probe method for measuring the intrinsic sheet resistance of single‐atom thick materials and could potentially open up new applications in RF electronics, AC quantum Hall effect metrology and sensors based on graphene 4TP devices operating over a broad range of frequencies.