reliability of electronic components in terms of time to failure. It is known that the reliability of
MLCCs depends on their composition, processing, and operating conditions. In this present
work, we analyzed the lifetime of three similar X7R type MLCCs based on BaTiO3 by
conducting High Accelerated Life Tests (HALT) at temperatures up to 200° C at 400 V and
600 V. The results were adjusted to an Arrhenius equation, which is a function of the …