We describe a simple method for performing high-resolution scanning near-field optical
microscopy (SNOM). A commercial Si 3 N 4 tip is illuminated by an intense light source,
which causes the tip to emit redshifted (inelastically scattered) light. Part of the redshifted
light passes through a sample, allowing transmission light microscopy. By simple
modification of a commercial atomic force microscopes (AFM), we are able to image many
different samples with high-resolution optical microscopy, achieving 20–30 nm lateral …