of simultaneous observation of surface morphology, has been developed. This was
achieved by using an electrically conducting atomic force microscopy cantilever as a probe
needle. Using this new SNDM, simultaneous measurements of several ferroelectric
materials, such as LiNbO3 single crystal and lead zirconate titanate (PZT) thin films on
SrTiO3 substrates, were performed. Topographic and domain images, which were …