Soft X-ray spectromicroscopy beamline at the CLS: commissioning results
KV Kaznatcheev, C Karunakaran, UD Lanke… - Nuclear Instruments and …, 2007 - Elsevier
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2007•Elsevier
The soft X-ray spectromicroscopy beamline (SM) at the Canadian Light Source (CLS) is a
dedicated spectromicroscopy facility, consisting of an elliptically polarized undulator (EPU),
a beamline based on a collimated PGM optimized for 100–2000eV range and two end
stations: scanning transmission X-ray microscope (STXM) and roll-in X-ray photoemission
electron microscope (X-PEEM, from Elmitec GmbH). The overall system has achieved its
design parameters with an on-sample flux of∼ 108ph/s@ R= 3000, 0.5 A in STXM and∼ …
dedicated spectromicroscopy facility, consisting of an elliptically polarized undulator (EPU),
a beamline based on a collimated PGM optimized for 100–2000eV range and two end
stations: scanning transmission X-ray microscope (STXM) and roll-in X-ray photoemission
electron microscope (X-PEEM, from Elmitec GmbH). The overall system has achieved its
design parameters with an on-sample flux of∼ 108ph/s@ R= 3000, 0.5 A in STXM and∼ …
The soft X-ray spectromicroscopy beamline (SM) at the Canadian Light Source (CLS) is a dedicated spectromicroscopy facility, consisting of an elliptically polarized undulator (EPU), a beamline based on a collimated PGM optimized for 100–2000eV range and two end stations: scanning transmission X-ray microscope (STXM) and roll-in X-ray photoemission electron microscope (X-PEEM, from Elmitec GmbH). The overall system has achieved its design parameters with an on-sample flux of ∼108ph/s@R=3000, 0.5A in STXM and ∼1012ph/s@R=3000, 0.5A in the PEEM, in each case at a spatial resolution exceeding 40nm. It can also provide an energy resolving power above 10,000. A careful EPU calibration procedure enables advanced polarization measurements.
Elsevier
以上显示的是最相近的搜索结果。 查看全部搜索结果