a Si substrate is reported. The peak–to–peak amplitude of terahertz radiation from the
sample is 9 times larger than that of THz radiation from a semi-insulating GaAs wafer. The
spectral width of the sample is larger than that of a semi-insulating GaAs wafer; in particular,
the spectral amplitude increases at higher frequencies. The presented GaAs microstructures
on a Si substrate can be suitable for practical and efficient THz sources required in various …