using the solid-state reaction method with double sintering. For the prepared compositions,
the dielectric measurements were carried out from room temperature to 480° C, at 10, 100,
and 1000 kHz. Dielectric measurements of the prepared samples indicated anomalies
around 210, 380, and 450° C. High temperature X-ray diffraction (HT-XRD) measurements
were carried out to analyze the structural properties of the samples, with x= 0.175 …