… to reduce test application time … capture-per-cycle observation points to record data while
regular scan cells are still being loaded, and to generate more compact test patterns by utilizing …

… hybrid test point technology designed to reduce deterministic … by significantly reducing test
application time while preserving … the concept of capture-per-cycle observation test points. The …

… Unlike the production test, the POST requires reducing the test application time to meet the
indispensable test … Full-scan LBIST with capture-per-cycle hybrid test points. In Proc. Intl…

… Test looks promising a way to reduce the test application … Degradation problem in multi-cycle
test. Based on the result of … Point Insertion technique (FF-CPI) to achieve the reduction of …

… capture-per-cycle hybrid-TPI technology by inserting some hybrid observation points to the
CUT (Circuit under Test… improving the test pattern reduction of multi-cycle test by enhancing …

… Finally, we address nontrivial processing challenges when fault simulating every … reduce
the simulation runtime. Recall (see Section II) that the capture-per-cycle observation test points …

… required for applying the test set is reduced, even at the cost of increasing the number of …
To demonstrate this point, Figure 3 shows the numbers of (k, 1)-cycle tests with 0 ≤ k ≤ K …

… the two POST mentioned above application test strategies to … multi-cycle test to logic
built-in self-test scheme to reduce the … a DFT method named FF-Control Point Insertion (FF-CPI) …

… reduce deterministic pattern counts, improve test coverage, and reduce both ATPG run time
and test application time… Zawada, “Full-scan LBIST with capture-per-cycle hybrid test points,” …

… Finally, we address nontrivial processing challenges when trying to fault sim… reduce the
simulation runtime itself. Recall (see Section II) that the capture-per-cycle observation test points …