Most atomic force microscopes employ the optical lever deflection method using a quadrant
photodetector as the displacement sensor of the cantilever, which enables it to detect lateral …

A novel method that uses a small mechanical lever has been developed to directly calibrate
the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The …

Abstract Development of micro machined cantilever and optical lever detection system has
greatly facilitated the operation of atomic force microscopy. However, since the detection …

Accurate force determinations in atomic force microscopy require the precise measurement
of cantilever deflections. A limiting factor in making these measurements is the calibration of …

In an atomic force microscope (AFM), the force is normally sensed by measuring the
deflection of a cantilever by an optical lever technique. Experimental results show a …

A novel atomic force microscope (AFM) has been developed. Unlike conventional AFM
systems, its cantilever and tip were set up in the X direction with respect to the sample. It can …

Force studies using atomic force microscopy generally require knowledge of the cantilever
spring constants and the optical lever sensitivity. The traditional method of evaluating the …

Using a simple model, we investigated the difference between the forces measured by an
atomic force microscope (AFM) with an optical lever deflection method and that with an …

The atomic force microscopy (AFM) is a very important tool for imaging and investigating the
complex force interactions on sample surfaces with high spatial resolution. In the AFM, two …

Atomic force microscopes typically require knowledge of the cantilever spring constant and
optical lever sensitivity in order to accurately determine the force from the cantilever …