Using a recently developed atomic force microscopy (AFM) simulator ACCESS (AFM
simulation Code for Calculating and Evaluating Surface Structures), effects of tip apex size …

A new tip characterizer based on the fabrication of multilayer thin films for atomic force
microscopy (AFM) was developed to analyze the effective tip shape while in use. The …

Using a newly developed atomic force microscopy (AFM) simulator ACCESS (AFM
simulation code for calculating and evaluating surface structures), effects of the atomic …

We investigated the use of a novel class of porous thin films for the characterization of
tapping mode atomic force microscope (AFM) tips. Chromium and titanium films were …

accepted for publication May 16, 1995) Variations of atomic force microscopy (AFM) images
as tip-sample distance is varied were examined using a newly developed AFM simulation …

The structure of the atomic arrangement at the apex of the tip plays an important role in the
atomic force microscope (AFM) images. Computer topographs of the sample surface were …

This article discusses the distortion of atomic force microscope (AFM) images of columnar
thin films caused by the finite size of the AFM tip. The amount of distortion in an image …

We report a study of tip artifacts in atomic force microscope (AFM) images of thin film
surfaces. Specifically, a troublesome artifact that occurs when an AFM tip images surface …

The atomic force microscope (AFM) is a powerful tool for measuring surface properties with
nanometer resolution. However, AFM measurements are highly dependent upon the nature …

This paper discusses the scanning performance of a trimmed atomic force microscope
(AFM) tip. A standard tip was trimmed by focused ion beam (FIB) sputtering to achieve a …