A novel calibration technique has been developed for lateral force microscopy (LFM).
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …

We have designed and tested a new, inexpensive, easy-to-make and easy-to-use
calibration standard for atomic force microscopy (AFM) lateral force measurements. This …

Proper force calibration is a critical step in atomic and lateral force microscopies (AFM/LFM).
The recently published torsional Sader method [CP Green et al, Rev. Sci. Instrum. 75, 1988 …

A proof-of-concept study is presented for a prototype atomic force microscope (AFM)
cantilever and associated calibration procedure that provide a path for quantitative friction …

A new and simple calibration method for atomic force microscopy (AFM) is developed. This
nonscanning method is based on direct force balances on surfaces with known slopes. The …

A novel calibration method is proposed for determining lateral forces in atomic force
microscopy (AFM), by introducing an angle conversion factor, which is defined as the ratio of …

Friction measurement via atomic force microscope (AFM) relies on accurate calibration for
the torsional spring constant of the AFM cantilever and its lateral deflection sensitivity. Here …

Quantitative force measurements performed using the atomic force microscope (AFM)
inherently rely on calibration of the AFM cantilever spring constant to convert the measured …

This paper reports corrections and improvements of the previously reported direct force
balance method (DFBM) developed for lateral calibration of atomic force microscopy. The …

A novel method that uses a small mechanical lever has been developed to directly calibrate
the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The …