We investigated the use of a novel class of porous thin films for the characterization of
tapping mode atomic force microscope (AFM) tips. Chromium and titanium films were …

A new tip characterizer based on the fabrication of multilayer thin films for atomic force
microscopy (AFM) was developed to analyze the effective tip shape while in use. The …

This article discusses the distortion of atomic force microscope (AFM) images of columnar
thin films caused by the finite size of the AFM tip. The amount of distortion in an image …

A tip characterizer for atomic force microscopy (AFM) was developed based on the
fabrication of multilayer thin films. Comb-shaped line and space (LS) and wedge-shaped …

We report a study of tip artifacts in atomic force microscope (AFM) images of thin film
surfaces. Specifically, a troublesome artifact that occurs when an AFM tip images surface …

Atomic force microscope (AFM) is commonly used for three-dimensional characterization of
the surface morphology of structures at nanoscale, but the “Inflation effect” of the tip is an …

This dissertation demonstrates the research effort to extend the analytical capabilities of
atomic force microscopy (AFM) by utilizing atom probe tomography (APT) to investigate AFM …

Atomic force microscopy (AFM) is increasingly relied on to image and measure micron and
submicron scale surface features. Consistent interpretation of AFM information is, however …

Knowledge of tip geometry is necessary for reproducible atomic force microscope (AFM)
measurements. This is particularly important for measurements in contact mode, in which a …

The ability to replace and reuse only the tip of the probe in an atomic force microscope
(AFM) enables employing a greater variety of probes, enhancing their functionalities, and …