Terahertz thickness determination with interferometric vibration correction for industrial applications

T Pfeiffer, S Weber, J Klier, S Bachtler, D Molter… - Optics …, 2018 - opg.optica.org
In many industrial fields, like automotive and painting industry, the thickness of thin layers is
a crucial parameter for quality control. Hence, the demand for thickness measurement …

Fastest thickness measurements with a terahertz time-domain system based on electronically controlled optical sampling

M Yahyapour, A Jahn, K Dutzi, T Puppe, P Leisching… - Applied Sciences, 2019 - mdpi.com
Featured Application Terahertz thickness gauging of polymers and paint layers; one-
hundred percent inspection of plastic pipes; process control. Abstract We apply a fast …

Continuous wave terahertz spectrometer as a noncontact thickness measuring device

R Wilk, F Breitfeld, M Mikulics, M Koch - Applied Optics, 2008 - opg.optica.org
We present a low cost terahertz (THz) spectrometer with coherent detection based on two
simple and robust dipole antennas driven by two laser diodes. The spectrometer covers …

Influence of system performance on layer thickness determination using terahertz time-domain spectroscopy

S Weber, L Liebelt, J Klier, T Pfeiffer, D Molter… - Journal of Infrared …, 2020 - Springer
The quality of coatings in industrial applications and scientific research with thicknesses in
the micrometer range is an important criterion for quality management. Therefore, thickness …

Extension of terahertz time-domain spectroscopy: A micron-level thickness gauging technology

H Zhang, L Shi, M He - Optics Communications, 2022 - Elsevier
There is a minimum measurable thickness when gauging micron-level coating films with
time-of-flight based terahertz thickness measurement technologies. To improve this …

A sensitive and versatile thickness determination method based on non-inflection terahertz property fitting

X Chen, E Pickwell-MacPherson - Sensors, 2019 - mdpi.com
The accuracy of thin-film characterization in terahertz spectroscopy is mainly set by the
thickness uncertainty. Physical thickness measurement has limited accuracy for thin-film …

Multilayer thickness determination using continuous wave THz spectroscopy

D Stanze, B Globisch, RJB Dietz… - IEEE Transactions …, 2014 - ieeexplore.ieee.org
We present a multilayer thickness measurement system based on optoelectronic continuous
wave THz spectroscopy. Due to its wide tuning range, high frequency resolution, and fast …

Highly accurate thickness measurement of multi-layered automotive paints using terahertz technology

S Krimi, J Klier, J Jonuscheit, G Von Freymann… - Applied Physics …, 2016 - pubs.aip.org
In this contribution, we present a highly accurate approach for thickness measurements of
multi-layered automotive paints using terahertz time domain spectroscopy in reflection …

Decoupling substrate thickness and refractive index measurement in THz time-domain spectroscopy

F Vandrevala, E Einarsson - Optics express, 2018 - opg.optica.org
Terahertz time-domain spectroscopy (THz–TDS) relies heavily on knowing precisely the
thickness or refractive index of a material. In practice, one of these values is assumed to be …

Terahertz multilayer thickness measurements: comparison of optoelectronic time and frequency domain systems

L Liebermeister, S Nellen, RB Kohlhaas… - Journal of Infrared …, 2021 - Springer
A bstract We compare a state-of-the-art terahertz (THz) time domain spectroscopy (TDS)
system and a novel optoelectronic frequency domain spectroscopy (FDS) system with …